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arXiv 2103.04552eess.IVcs.CV

U-DuDoNet: Unpaired dual-domain network for CT metal artifact reduction

Z 2 Sky Technologies Inc.(Z 2 天空科技公司);Beijing University of Posts and Telecommunications(北京邮电大学);Johns Hopkins University(约翰斯·霍普金斯大学);Suzhou Institute for Advance Research, University of Science and Technology of China(中国科学技术大学苏州研究院);Key Lab of Intelligent Information Processing of Chinese Academy of Sciences (CAS), Institute of Computing Technology, CAS(中国科学院计算技术研究所中国科学院智能信息处理重点实验室)

Yuanyuan Lyu, Jiajun Fu, Cheng Peng, S. Kevin Zhou

英文摘要:

Recently, both supervised and unsupervised deep learning methods have been widely applied on the CT metal artifact reduction (MAR) task. Supervised methods such as Dual Domain Network (Du-DoNet) work well on simulation data; however, their performance on clinical data is limited due to domain gap. Unsupervised methods are more generalized, but do not eliminate artifacts completely through the sole processing on the image domain. To combine the advantages of both MAR methods, we propose an unpaired dual-domain network (U-DuDoNet) trained using unpaired data. Unlike the artifact disentanglement network (ADN) that utilizes multiple encoders and decoders for disentangling content from artifact, our U-DuDoNet directly models the artifact generation process through additions in both sinogram and image domains, which is theoretically justified by an additive property associated with metal artifact. Our design includes a self-learned sinogram prior net, which provides guidance for restoring the information in the sinogram domain, and cyclic constraints for artifact reduction and addition on unpaired data. Extensive experiments on simulation data and clinical images demonstrate that our novel framework outperforms the state-of-the-art unpaired approaches.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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