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arXiv 2102.11999cond-mat.mes-hall
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用于电流噪声测量的低温GaAs高电子迁移率晶体管放大器

Cryogenic GaAs high-electron-mobility-transistor amplifier for current noise measurements

Sanghyun Lee, Masayuki Hashisaka, Takafumi Akiho, Kensuke Kobayashi, Koji Muraki

摘要:

我们表明,由国产GaAs高电子迁移率晶体管(HEMT)组成的低温放大器适用于在稀释制冷温度下测量介观器件中的电流噪声。我们自制的HEMT的低噪声特性导致在实验设置中的低噪声基底,并实现比商业HEMT更有效的电流噪声测量。我们提出的HEMT的直流传输特性和放大器的增益和噪声特性。与用于量子点接触的电流噪声测量的放大器,我们证明了高分辨率的测量设置,通过比较它与传统的一个使用商业HEMT。

英文摘要:

We show that a cryogenic amplifier composed of a homemade GaAs high-electron-mobility transistor (HEMT) is suitable for current-noise measurements in a mesoscopic device at dilution-refrigerator temperatures. The lower noise characteristics of our homemade HEMT leads to a lower noise floor in the experimental setup and enables more efficient current-noise measurement than is available with a commercial HEMT. We present the dc transport properties of the HEMT and the gain and noise characteristics of the amplifier. With the amplifier employed for current-noise measurements in a quantum point contact, we demonstrate the high resolution of the measurement setup by comparing it with that of the conventional one using a commercial HEMT.

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