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arXiv 2102.05709cs.SEcs.CR
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SN4KE:二进制水平的实用突变测试

SN4KE: Practical Mutation Testing at Binary Level

Mohsen Ahmadi, Pantea Kiaei, Navid Emamdoost

摘要:

变异分析是一种有效的技术,以评估测试套件的充分性,揭示不可预见的软件错误。传统的源或IR级突变分析不适用于仅以二进制格式提供的软件。本文提出了一个实用的二进制变异分析,通过二进制重写,随着丰富的变异算子,以代表更现实的错误。我们实现了我们的方法,使用两个国家的最先进的二进制重写工具,并评估其有效性和可扩展性,通过将它们应用到SPEC CPU基准测试。我们的分析表明,更丰富的突变算子有助于产生更多样化的突变体,这与以前的作品相比,导致更高的突变得分的测试线束。我们还得出结论,realizable反汇编重写产生更好的可扩展性相比,提升到一个中间表示,并执行一个完整的翻译。

英文摘要:

Mutation analysis is an effective technique to evaluate a test suite adequacy in terms of revealing unforeseen bugs in software. Traditional source- or IR-level mutation analysis is not applicable to the software only available in binary format. This paper proposes a practical binary mutation analysis via binary rewriting, along with a rich set of mutation operators to represent more realistic bugs. We implemented our approach using two state-of-the-art binary rewriting tools and evaluated its effectiveness and scalability by applying them to SPEC CPU benchmarks. Our analysis revealed that the richer mutation operators contribute to generating more diverse mutants, which, compared to previous works leads to a higher mutation score for the test harness. We also conclude that the reassembleable disassembly rewriting yields better scalability in comparison to lifting to an intermediate representation and performing a full translation.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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