电阻存储器随机单元失效时数据和潜径干扰的近最优检测
Near-Optimal Detection for Both Data and Sneak-Path Interference in Resistive Memories with Random Cell Selector Failures
摘要：
电阻式随机存取存储器是下一代非易失性存储器技术中最有前途的候选者之一。然而，它的交叉结构造成严重的“潜路径”干扰，这也导致了强的小区间相关性。最近的工作主要集中在次优的数据检测方案，忽略小区间的相关性和处理的潜行路径干扰作为独立的噪声。我们提出了一个接近最优的数据检测方案，可以接近最优检测方案的性能界限。我们的检测方案利用联合数据和潜路径干扰恢复，并可以使用所有的小区间相关性。该方案适用于运算复杂度仅为线性的大型存储器阵列的数据检测。
英文摘要：
Resistive random-access memory is one of the most promising candidates for the next generation of non-volatile memory technology. However, its crossbar structure causes severe "sneak-path" interference, which also leads to strong inter-cell correlation. Recent works have mainly focused on sub-optimal data detection schemes by ignoring inter-cell correlation and treating sneak-path interference as independent noise. We propose a near-optimal data detection scheme that can approach the performance bound of the optimal detection scheme. Our detection scheme leverages a joint data and sneak-path interference recovery and can use all inter-cell correlations. The scheme is appropriate for data detection of large memory arrays with only linear operation complexity.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
