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arXiv 2101.04471physics.plasm-ph
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ASDEX升级实验中的电子逃逸

Electron runaway in ASDEX Upgrade experiments of varying core temperature

O. Linder, G. Papp, E. Fable, F. Jenko, G. Pautasso, the ASDEX Upgrade Team, the EUROfusion MST1 Team

摘要:

在ASDEX升级材料注入实验中,大量破坏后逃逸电子电流的形成由逃逸电子的小种子种群的雪崩倍增确定。对于这些情况下的调查,逃逸电子的描述耦合1.5D传输求解器ASTRA-STRAHL的流体模型描述热尾机制引起的电子逃逸进行了修改。应用于ASDEX升级放电#33108中的组合背景等离子体演化、材料注入和逃逸电子生成的模拟中,用于电子逃逸的Dreicer和热尾机制都仅产生$\sim$ 3 $~$ kA的逃逸电流。在较冷的等离子体与核心电子温度$T_\mathrm{e,c}$低于9 $~$ keV,后中断失控电流被预测为不敏感的初始温度,与实验观察。然而,在更热的等离子体与$T_\mathrm{e,c} > 10~\mathrm{keV}$,热尾失控可以增加高达一个数量级,大大有助于总的破坏后失控电流。然而,在ASDEX升级高温失控实验中,尽管初级和次级失控条件有利,但在中断结束时没有观察到失控电流。

英文摘要:

The formation of a substantial post-disruption runaway electron current in ASDEX Upgrade material injection experiments is determined by avalanche multiplication of a small seed population of runaway electrons. For the investigation of these scenarios, the runaway electron description of the coupled 1.5D transport solvers ASTRA-STRAHL is amended by a fluid-model describing electron runaway caused by the hot-tail mechanism. Applied in simulations of combined background plasma evolution, material injection, and runaway electron generation in ASDEX Upgrade discharge #33108, both the Dreicer and hot-tail mechanism for electron runaway produce only $\sim$ 3$~$kA of runaway current. In colder plasmas with core electron temperatures $T_\mathrm{e,c}$ below 9$~$keV, the post-disruption runaway current is predicted to be insensitive to the initial temperature, in agreement with experimental observations. Yet in hotter plasmas with $T_\mathrm{e,c} > 10~\mathrm{keV}$, hot-tail runaway can be increased by up to an order of magnitude, contributing considerably to the total post-disruption runaway current. In ASDEX Upgrade high temperature runaway experiments, however, no runaway current is observed at the end of the disruption, despite favourable conditions for both primary and secondary runaway.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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