二向色滤光片的Mueller矩阵图揭示了偏振像差
Mueller matrix maps of dichroic filters reveal polarization aberrations
摘要：
仪器设计人员使用二向色滤光片将视场分成不同的光路，以便同时测量不同的光谱带。量化二向色镜的偏振像差对于预测下游入射偏振态具有重要意义，而下游入射偏振态会影响衍射极限系统的性能。一个重要的应用是系外行星成像日冕仪的前置光学。在这项工作中，埃德蒙#69-205 650 nm滚降分色的偏振特性测量使用旋转延迟器穆勒矩阵成像偏振仪。在正常和45 $^{\circ}$入射角下比较了这种商用二向色性的偏振特性。法向入射测量验证了仪器校准，因为没有观察到偏振像差。在680 nm和45 $^{\circ}$下的透射测量产生2.9 rad的延迟量和0.95的二向衰减。实际上，在630 nm处，二向色性是具有水平快轴的$λ$ /4波片。
英文摘要：
Dichroic filters are used by instrument designers to split a field of view into different optical paths for simultaneous measurement of different spectral bands. Quantifying the polarization aberrations of a dichroic is relevant for predicting the incident polarization states downstream, which could affect the performance of diffraction limited systems. One important application is the fore-optics of exoplanet imaging coronagraphs. In this work, the polarization properties of the Edmund #69-205 650 nm roll-off dichroic are measured using a rotating retarder Mueller matrix imaging polarimeter. The polarization properties of this commercial dichroic are compared at normal and 45$^{\circ}$ angle of incidence. The normal incidence measurements verify the instrument calibration since no polarization aberrations were observed. Transmission measurements at 680 nm and 45$^{\circ}$ yield a 2.9 rad magnitude of retardance and 0.95 diattenuation. Effectively, at 630 nm the dichroic is a $λ$/4 waveplate with a horizontal fast-axis.
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