通过停留时间测量定位缺陷
Localization of defects via residence time measures
摘要：
我们证明了停留时间测度可以用来识别沿路径的缺陷的几何和传输特性。晶格的位置是规则的，即，除了称为\emph{defect}的站点之外，每个站点中的跳跃概率相同，其中跳跃概率不同。在晶格的每一侧存在吸收位点。我们表明，通过测量穿过通道的粒子的分数和/或他们需要穿过它的典型时间，它是可能的，以确定晶格的主要特征和缺陷的网站，即，跳跃概率在定期和在缺陷的网站和缺陷的位置在晶格中。
英文摘要：
We show that residence time measure can be used to identify the geometrical and transmission properties of a defect along a path. The model we study is based on a one--dimensional simple random walk. The sites of the lattice are regular, i.e., the jumping probabilities are the same in each site, except for a site, called \emph{defect}, where the jumping probabilities are different. At each side of the lattice an absorbing site is present. We show that by measuring the fraction of particles crossing the channel and/or the typical time they need to cross it, it is possible to identify the main features of the lattice and of the defect site, namely, the jumping probabilities at regular and at the defect sites and the position of the defect in the lattice.
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