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arXiv 2008.09343cond-mat.mtrl-sci
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半导体应变掺杂行为的统一理论和基本规律

A Unified Theory and Fundamental Rules of Strain-dependent Doping Behaviors in Semiconductors

Xiaolan Yan, Pei Li, Su-Huai Wei, Bing Huang

摘要:

通过应变工程增强半导体的掺杂性对于改善其功能至关重要,然而,由于缺乏基本规则,这在很大程度上受到阻碍。在这封信中,我们第一次开发了一个统一的理论来理解应变下具有不同电荷状态的缺陷(或掺杂剂)的总能量变化,这些变化可以表现出抛物线或超线性行为,由缺陷引起的局部体积变化(ΔV)的大小决定。一般来说,当电子被添加到缺陷位置(从缺陷位置移除)时,ΔV增加(减少)。因此,根据这个统一的理论,可以得到三个基本规则,以进一步理解或预测不同的应变相关掺杂行为,即,半导体中的缺陷形成能、电荷态跃迁能级和费米钉扎能级。这三个基本规则可以普遍应用于改善掺杂性能或克服各种半导体中的掺杂瓶颈。

英文摘要:

Enhancing the dopability of semiconductors via strain engineering is critical to improving their functionalities, which is, however, largely hindered by the lack of fundamental rules. In this Letter, for the first time, we develop a unified theory to understand the total energy changes of defects (or dopants) with different charge states under strains, which can exhibit either parabolic or superlinear behaviors, determined by the size of defect-induced local volume change (ΔV). In general, ΔV increases (decreases) when an electron is added (removed) to (from) the defect site. Consequently, in terms of this unified theory, three fundamental rules can be obtained to further understand or predict the diverse strain-dependent doping behaviors, i.e., defect formation energies, charge-state transition levels, and Fermi pinning levels, in semiconductors. These three fundamental rules could be generally applied to improve the doping performance or overcome the doping bottlenecks in various semiconductors.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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