基于Mach-Zehnder干涉仪的音叉微波阻抗显微镜
A Mach-Zehnder interferometer based tuning fork microwave impedance microscope
摘要：
我们在这里描述了一个基于干涉仪的微波阻抗显微镜上自制的音叉扫描探针显微镜（SPM）的实现。基于音叉的SPM仅需要两个电触点用于音叉振荡的自致动和自检测，特别适合于在诸如低温、高磁场或受限几何形状的极端环境中操作，在这些极端环境中，难以引入用于悬臂偏转的常规检测所需的光学部件。大多数现有的和商业上可用的系统依赖于专门设计的微波偏转器的偏转的光学检测，限制了它们的应用。一个音叉的微波阻抗显微镜与谐振腔附近的尖端最近实施：我们在这里报告的增强，采用微波干涉仪，它提供了更好的信号噪声以及更广泛的可调谐性微波频率。
英文摘要：
We describe here the implementation of an interferometer-based microwave impedance microscope on a home-built tuning-fork based scanning probe microscope (SPM). Tuning-fork based SPMs, requiring only two electrical contacts for self-actuation and self-detection of the tuning fork oscillation, are especially well suited to operation in extreme environments such as low temperatures, high magnetic fields or restricted geometries where the optical components required for conventional detection of cantilever deflection would be difficult to introduce. Most existing and commercially available systems rely on optical detection of the deflection of specially designed microwave cantilevers, limiting their application. A tuning-fork based microwave impedance microscope with a resonant cavity near the tip was recently implemented: we report here an enhancement that incorporates a microwave interferometer, which affords better signal to noise as well as wider tunability in terms of microwave frequency.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
