基于Total internal reflection的亚红外超分辨成像
Total internal reflection based super-resolution imaging for sub-IR frequencies
摘要：
对于设计用于精确确定层厚度的测量，由于聚焦光束所需的角射线分布，在对光学厚度的灵敏度和横向分辨率之间存在自然的权衡。我们展示了一种近场成像方法，使亚波长的横向分辨率和光学厚度灵敏度。我们在全内反射几何结构中照射样品，在近场中使用光激活空间调制器，这使得光学厚度图像可以在几秒钟内进行计算重建。我们展示了我们的方法在140 GHz（波长2.15 mm），图像通常是严重限制在空间分辨率，并展示映射的光学厚度变化在不均匀的生物组织。
英文摘要：
For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate a near-field imaging approach that enables both sub-wavelength lateral resolution and optical thickness sensitivity. We illuminate a sample in a total internal reflection geometry, with a photo-activated spatial modulator in the near-field, which allows optical thickness images to be computationally reconstructed in a few seconds. We demonstrate our approach at 140 GHz (wavelength 2.15 mm), where images are normally severely limited in spatial resolution, and demonstrate mapping of optical thickness variation in inhomogeneous biological tissues.
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