arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2005.09355cond-mat.mes-hallcond-mat.mtrl-sci
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电容谱法测定InAs二维电子体系中的$g$ -因子

Determination of $g$-factor in InAs two-dimensional electron system by capacitance spectroscopy

Hiroshi Irie, Takafumi Akiho, Koji Muraki

摘要:

我们用一种基于电容谱的新方法测定了二维电子气的有效$g$因子($|g^\ast|$)。在面内磁场中测量的InAs/AlGaSb量子阱中二维电子气的电容-电压分布显示出双台阶特征,表明子带边缘的塞曼分裂。该方法允许同时和独立测定$|g^\ast|$和有效质量$m^\ast$。数据表明,在InAs层中的双轴拉伸应变对$m^\ast$和$g^\ast$都有相当大的影响。我们的方法提供了一种测定$|g^\ast|$的方法,该方法与常用的符合技术互补。

英文摘要:

We determine the effective $g$-factor ($|g^\ast|$) of a two-dimensional electron gas (2DEG) using a new method based on capacitance spectroscopy. The capacitance-voltage profile of a 2DEG in an InAs/AlGaSb quantum well measured in an in-plane magnetic field shows a double-step feature that indicates the Zeeman splitting of the subband edge. The method allows for simultaneous and independent determination of $|g^\ast|$ and effective mass $m^\ast$. Data suggest that the biaxial tensile strain in the InAs layer has considerable impacts on both $m^\ast$ and $g^\ast$. Our method provides a means to determine $|g^\ast|$ that is complementary to the commonly used coincidence technique.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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