束流测量系统中的模数转换
Analog to digital conversion in beam instrumentation systems
摘要：
模数转换是几乎所有束流测量系统的重要组成部分。理想情况下，在适当设计的系统中，所使用的模数转换器（ADC）不应限制系统性能。然而，尽管ADC技术最近有所改进，但这通常是不可能的，ADC的选择会显著影响甚至限制系统性能。因此，在系统设计的早期阶段估计模数转换的要求并评估是否可以找到满足系统规格的适当ADC非常重要。在需要高时间和幅度分辨率的射束仪表系统的情况下，如果不在数字化之前对模拟信号进行特殊处理，则通常会发生可用ADC无法满足系统规格的情况。在这种情况下，对ADC的要求甚至会影响系统架构。本文旨在帮助束流测量系统的设计人员在选择ADC的过程中，这在许多情况下是迭代的，需要在系统性能、复杂性和成本之间进行权衡。模拟到数字转换是广泛和良好的文献中描述，因此，本文主要集中在有关方面的束流仪器。ADC基础知识仅限于与本文对应的CAS一小时讲座中的介绍内容。
英文摘要：
Analog to digital conversion is a very important part of almost all beam instrumentation systems. Ideally, in a properly designed system, the used analog to digital converter (ADC) should not limit the system performance. However, despite recent improvements in ADC technology, quite often this is not possible and the choice of the ADC influences significantly or even restricts the system performance. It is therefore very important to estimate the requirements for the analog to digital conversion at an early stage of the system design and evaluate whether one can find an adequate ADC fulfilling the system specification. In case of beam instrumentation systems requiring both, high time and amplitude resolution, it often happens that the system specification cannot be met with the available ADCs without applying special processing to the analog signals prior to their digitisation. In such cases the requirements for the ADC even influence the system architecture. This paper aims at helping the designer of a beam instrumentation system in the process of selecting an ADC, which in many cases is iterative, requiring a trade off between system performance, complexity and cost. Analog to digital conversion is widely and well described in the literature, therefore this paper focusses mostly on aspects related to beam instrumentation. The ADC fundamentals are limited to the content presented as an introduction during the CAS one-hour lecture corresponding to this paper.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
