纳米狭缝结构探测薄层的共振频率灵敏度
Sensitivity of resonance frequency in the detection of thin layer using nano-slit structures
摘要：
推导了纳米狭缝结构用于薄层探测时的共振频率及其灵敏度的计算公式。对于沉积在纳米结构上的厚度为$H$的薄层，我们定量地表明，对于具有狭缝孔径尺寸$δ$的单个和周期性狭缝结构，谐振频率的灵敏度随着$H$的增加而降低。具体地，如果$H >δ$，则灵敏度为$O(δ/H)$阶，否则为$O(1+\ln H/δ)$阶。在介质薄膜与周围介质的界面上存在倏逝波模。从数学推导中可以看出，谐振频率的灵敏度很大程度上取决于微小狭缝上的倏逝波模式的影响。
英文摘要：
We derive the formulas for the resonance frequencies and their sensitivity when the nano-slit structures are used in the detection of thin layers. For a thin layer with a thickness of $H$ deposited over the nanostructure, we show quantitatively that for both single and periodic slit structures with slit aperture size $δ$, the sensitivity of resonance frequency reduces as $H$ increases. Specifically, the sensitivity is of order $O(δ/H)$ if $H >δ$ and of order $O(1+\ln H/δ)$ otherwise. The evanescent wave modes are present along the interface between the thin dielectric film and ambient medium above. From the mathematical derivations, it is observed that the sensitivity of the resonance frequency highly depends on the effect of evanescent wave modes on the tiny slit apertures.
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