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arXiv 2005.00655cond-mat.mtrl-sci
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扫描探针显微术中探针/离子导体界面的局域电子输运

Local electronic transport across probe/ionic conductor interface in scanning probe microscopy

K. N. Romanuk, D. O. Alikin, B. N. Slautin, A. Tselev, V. Ya. Shur, A. L. Kholkin

摘要:

载流子通过探针-样品结的传输可以对电子和机电原子力显微镜(AFM)测量的结果产生重大影响。为了理解探针下的物理过程,我们进行了局部电流-电压(I-V)曲线的导电AFM(C-AFM)测量,以及它们的衍生物上的混合离子-电子导体Li 1-xMn 2 O 4的样品,并开发了一个分析框架的数据分析。所实施的方法区分贡献的高电阻的样品表面层和散装与帐户的离子再分布在该领域的探针。结果表明,随着探针电压的增加,表面层的电导机制从Pool-Frenkel转变为空间电荷限制电流。的表面层显着改变的离子动力学在探针下的样品散装,这导致,特别是,与样品中的离子运动相关的有效的机电AFM信号的减少。该框架可以应用于分析的机制,电子传输的探针/样品界面,以及在电场分布,机械,和其他响应的原子力显微镜测量的广泛的导电材料的电荷传输的作用。

英文摘要:

Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurements. For understanding physical processes under the probe, we carried out conductive-AFM (C-AFM) measurements of local current-voltage (I-V) curves as well as their derivatives on samples of a mixed ionic-electronic conductor Li1-xMn2O4 and developed an analytical framework for the data analysis. The implemented approach discriminates between contributions of a highly resistive sample surface layer and bulk with the account of ion redistribution in the field of the probe. It was found that with increasing probe voltage, the conductance mechanism in the surface layer transforms from Pool-Frenkel to space-charge-limited current. The surface layer significantly alters the ion dynamics in the sample bulk under the probe, which leads, in particular, to a decrease of the effective electromechanical AFM signal associated with the ionic motion in the sample. The framework can be applied for the analysis of mechanisms of electronic transport across the probe/sample interface as well as the role of the charge transport in the electric field distribution, mechanical, and other responses in AFM measurements of a broad spectrum of conducting materials.

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