晶体管随机模型中的计数统计和微可逆性
Counting statistics and microreversibility in stochastic models of transistors
摘要：
本文建立了晶体管的三种随机模型中的多变量涨落关系，晶体管是具有三个端口的电子器件，因此有两个耦合电流。在第一个模型中，晶体管没有内部状态变量，端口之间的粒子交换被描述为具有恒定速率的马尔可夫跳跃过程。在第二个模型中，速率线性地依赖于内部随机变量，表示晶体管被载流子占据。第三个模型的利率非线性依赖于内部占用。对于第一个和第二个模型，有限时间的多元波动关系也建立了洞察到收敛到渐近形式的多元波动关系的长时间限制。对于所有这三种模型，运输性能满足Onsager的互惠关系，在线性政权接近平衡，以及他们的概括举行的非线性政权远离平衡，作为微观可逆性的后果。
英文摘要：
Multivariate fluctuation relations are established in three stochastic models of transistors, which are electronic devices with three ports and thus two coupled currents. In the first model, the transistor has no internal state variable and particle exchanges between the ports is described as a Markov jump process with constant rates. In the second model, the rates linearly depend on an internal random variable, representing the occupancy of the transistor by charge carriers. The third model has rates nonlinearly depending on the internal occupancy. For the first and second models, finite-time multivariate fluctuation relations are also established giving insight into the convergence towards the asymptotic form of multivariate fluctuation relations in the long-time limit. For all the three models, the transport properties are shown to satisfy Onsager's reciprocal relations in the linear regime close to equilibrium as well as their generalizations holding in the nonlinear regimes farther away from equilibrium, as a consequence of microreversibility.
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