谱域Z扫描技术
Spectral Domain Z-scan Technique
摘要：
表征各种材料的非线性光学性质是研究非线性光学的前提。在不同的方法中，众所周知的Z扫描技术和修改的版本已被公认为是一种简单而准确的方法，用于测量非线性折射率的实部和虚部。然而，所有的Z-扫描方法的基础上检测小光束变化提出了一个严格的限制材料的粗糙度。因此，测量高散射介质的非线性光学性质仍然是具有挑战性的。受传统Z扫描方法将波前相移转换为远场易于测量的空间方向图的创新，本文提出了交替谱域Z扫描技术。由于米氏散射的波长远小于粗糙度，其散射效率对波长不敏感，因此在高散射介质中具有很大的潜力。此外，为了证明谱域Z扫描技术的优越性，我们还测量了抛光和磨砂玻片的非线性折射率，结果与以往的报道一致。
英文摘要：
Characterizing the nonlinear optical properties of various materials plays a prerequisite role in nonlinear optics. Among different methods, the well-known Z-scan technique and the modified versions have been recognized as a simple and accurate method for measuring both the real and imaginary parts of the nonlinear refractive index. However, all the Z-scan methods based on detecting small beam variations put forward a severe restriction on the roughness of materials. Therefore, measuring nonlinear optical properties of highly scattering media still remain challenging. Inspired by the innovation of conventional Z-scan method that converting the wavefront phase shift to the easily measurable spatial pattern in far-field, the alternative spectral domain Z-scan technique was presented in this paper. It has a great potential for highly scattering medium, based on the scattering efficiency is insensitive to the wavelength for Mie scattering as the wavelengths are far smaller than the roughness. Moreover, to demonstrate the advantages of spectral domain Z-scan technique, the nonlinear refraction of polished slides and frosted slides was measured, which agrees well with previous reports.
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