We present a method for the measurement of the phase gradient of a wavefront by tracking the relative motion of speckles in projection holograms as a sample is scanned across the wavefront. By removing the need to obtain an un-distorted reference image of the sample, this method is suitable for the metrology of highly divergent wavefields. Such wavefields allow for large magnification factors, that, according to current imaging capabilities, will allow for nano-radian angular sensitivity and nano-scale sample projection imaging. Both the reconstruction algorithm and the imaging geometry are nearly identical to that of ptychography, except that the sample is placed downstream of the beam focus and that no coherent propagation is explicitly accounted for. Like other x-ray speckle tracking methods, it is robust to low-coherence x-ray sources making is suitable for lab based x-ray sources. Likewise it is robust to errors in the registered sample positions making it suitable for x-ray free-electron laser facilities, where beam pointing fluctuations can be problematic for wavefront metrology. We also present a modified form of the speckle tracking approximation, based on a second-order local expansion of the Fresnel integral. This result extends the validity of the speckle tracking approximation and may be useful for similar approaches in the field.
In recent years, x-ray speckle tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement of near-field images. Thanks to the simple experimental set-up, high angular sensitivity and compatibility with low coherence sources these methods have been actively developed for use with synchrotron and laboratory light sources. Not only do speckle-tracking techniques give the potential for high resolution imaging, but they also provide rapid and robust characterisation of aberrations of x-ray optical elements, fo…
The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, and functional matter on the nanometre scale with chemical sensitivity. Hard x-rays are ideal for high-resolution imaging and spectroscopic applications due to their short wavelength, high penetrating power, and chemical sensitivity. The penetrating power that makes x-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques that have enabled the fa…
Scattering can rapidly degrade our ability to form an optical image, to the point where only speckle-like patterns can be measured. Truly non-invasive imaging through a strongly scattering obstacle is difficult, and usually reliant on a computationally intensive numerical reconstruction. In this work we show that, by combining the cross-correlations of the measured speckle pattern at different times, it is possible to track a moving object with minimal computational effort and over a large field of view.
As a promising lensless imaging method for distance objects, intensity interferometry imaging (III) had been suffering from the unreliable phase retrieval process, hindering the development of III for decades. Recently, the introduction of the ptychographic detection in III overcame this challenge, and a method called ptychographic III (PIII) was proposed. We here experimentally demonstrate that PIII can image a dynamic distance object. A reasonable image for the moving object can be retrieved with only two speckle patterns for each probe, and only 10 to 20 iterations are needed. Meanwhile, PI…
Tsinghua University（清华大学）；California Institute of Technology（加州理工学院）
Fourier ptychographic microscopy (FPM) is a novel computational coherent imaging technique for high space-bandwidth product imaging. Mathematically, Fourier ptychographic (FP) reconstruction can be implemented as a phase retrieval optimization process, in which we only obtain low resolution intensity images corresponding to the sub-bands of the sample's high resolution (HR) spatial spectrum, and aim to retrieve the complex HR spectrum. In real setups, the measurements always suffer from various degenerations such as Gaussian noise, Poisson noise, speckle noise and pupil location error, which w…
We develop X-ray Multi-modal Intrinsic-Speckle-Tracking (MIST), a form of X-ray speckle-tracking that is able to recover both the position-dependent phase shift and the position-dependent small-angle X-ray scattering (SAXS) signal of a phase object. MIST is based on combining a Fokker-Planck description of paraxial X-ray optics, with an optical-flow formalism for X-ray speckle-tracking. Only two images need to be taken in the presence of the sample, corresponding to two different transverse positions of the speckle-generating membrane, in order to recover both the refractive and local-SAXS pro…
Acousto-optic imaging (AOI) enables optical-contrast imaging deep inside scattering samples via localized ultrasound-modulation of scattered light. While AOI allows optical investigations at depths, its imaging resolution is inherently limited by the ultrasound wavelength, prohibiting microscopic investigations. Here, we propose a novel computational imaging approach that allows to achieve optical diffraction-limited imaging using a conventional AOI system. We achieve this by extracting diffraction-limited imaging information from 'memory-effect' speckle-correlations in the conventionally dete…
Achieving high spatial resolution is the goal of many imaging systems. Designing a high-resolution lens with diffraction-limited performance over a large field of view remains a difficult task in imaging system design. On the other hand, creating a complex speckle pattern with wavelength-limited spatial features is effortless and can be implemented via a simple random diffuser. With this observation and inspired by the concept of near-field ptychography, we report a new imaging modality, termed near-field Fourier ptychography, for tackling high-resolution imaging challenges in both microscopic…
We demonstrate computerized tomography (CT) reconstructions from absorption, phase and dark-field signals obtained from scans acquired when the x-ray probe light is modulated with speckle. Two different interlaced schemes are proposed to reduce the number of sample exposures. First, the already demonstrated x-ray speckle-vector tracking (XSVT) concept for projection imaging allows the three signal CT reconstructions from multiple images per projection. Second, a modified XSVT approach is shown to provide absorption and phase reconstructions, this time from a single image per angular projection…
The random intensity distribution observed due to the propagation of a coherent beam of light through a scattering medium is known as a speckle pattern. The interaction of the speckles with a birefringent crystal, here, YVO4 results in the e-ray and o-ray speckles. It is observed that the e-ray and o-ray speckles experience an angular shift with the rotation of the crystal and the shift depends on the rotation angle of the crystal. It is also found that the rate of the shift is different for e-ray and o-ray speckles, and is independent of the topological charge of the beam incident on the scat…
Label free tracking of small bio-particles such as proteins or viruses is of great utility in the study of biological processes, however such experiments are frequently hindered by weak signal strengths and a susceptibility to scattering impurities. To overcome these problems we here propose a novel technique leveraging the enhanced sensitivity of both interferometric detection and the strong field confinement of surface plasmons. Specifically, we show that interference between the field scattered by an analyte particle and a speckle reference field, derived from random scattering of surface p…
A technique based on speckle contrast measurement is proposed and demonstrated to track the polarization rotation of an optical beam behind a scattering layer. It is shown that with the help of a reference speckle pattern with a known linear polarization, it is possible to track the polarization rotation behind a scattering layer in a non-invasive manner by measuring the contrast of the resultant speckle pattern. Working principle and experimental demonstration are presented, and results are compared with the theoretically known results in certain cases. Performance of the proposed technique i…
Under weak illumination, tracking and imaging moving object turns out to be hard. By spatially collecting the signal, single pixel imaging schemes promise the capability of image reconstruction from low photon flux. However, due to the requirement on large number of samplings, how to clearly image moving objects is an essential problem for such schemes. Here we present a principle of single pixel tracking and imaging method. Velocity vector of the object is obtained from temporal correlation of the bucket signals in a typical computational ghost imaging system. Then the illumination beam is st…
We present a Monte Carlo rendering framework for the physically-accurate simulation of speckle patterns arising from volumetric scattering of coherent waves. These noise-like patterns are characterized by strong statistical properties, such as the so-called memory effect, which are at the core of imaging techniques for applications as diverse as tissue imaging, motion tracking, and non-line-of-sight imaging. Our framework allows for these properties to be replicated computationally, in a way that is orders of magnitude more efficient than alternatives based on directly solving the wave equatio…
Forward-viewing endoscopic optical coherence tomography (OCT) provides 3D imaging in vivo, and can be combined with widefield fluorescence imaging by use of a double-clad fiber. However, it is technically challenging to build a high-performance miniaturized 2D scanning system with a large field-of-view. In this paper we demonstrate how a 1D scanning probe, which produces cross-sectional OCT images (B-scans) and 1D fluorescence T-scans, can be transformed into a 2D scanning probe by manual scanning along the second axis. OCT volumes are assembled from the B-scans using speckle decorrelation mea…
Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabrication of optical elements or to design phase correctors to compensate for these errors. Nowadays, the characterization of such optics is made using intense X-ray sources such as synchrotrons. However, the limited access to these facilities can substantially slow down the development process. Improvements in the brightness of lab-based X-ray micro-sources in combination with the development of new metrology methods,…
