二维空穴气体对氢端金刚石的迁移率限制机理分析
Analysis of the Mobility-Limiting Mechanisms of the Two-Dimensional Hole Gas on Hydrogen-Terminated Diamond
摘要：
在这里，我们提出了一个二维空穴气体的流动性限制机制的氢终止金刚石表面的分析。包括表面杂质、表面粗糙度、非极性光学声子和声学声子的散射率。使用薛定谔/泊松求解器，重孔，轻孔，和分裂带分别处理。为了将计算结果与实验数据进行比较，在25至700 K的温度范围内制造并测量了霍尔效应结构，其中孔片密度范围为2至6 $\times10^{12}\;\text{cm}^{-2}$，并且在室温下测量的典型迁移率为60至100 cm $^{2}$ /（V $\cdot$ s）。还使用了来自文献的现有数据，其跨越大于1 $\times10^{13}\;\text{cm}^{-2}$的片材密度。我们的分析表明，对于低的片密度，表面杂质散射带电受体和表面粗糙度是不足以占低流动性。此外，实验数据表明，长程电位波动存在于金刚石表面，特别是在较低的片密度增强。因此，我们提出了第二种类型的表面杂质散射，这是由无序相关的C-H偶极子。
英文摘要：
Here we present an analysis of the mobility-limiting mechanisms of a two-dimensional hole gas on hydrogen-terminated diamond surfaces. The scattering rates of surface impurities, surface roughness, non-polar optical phonons, and acoustic phonons are included. Using a Schrodinger/Poisson solver, the heavy hole, light hole, and split-off bands are treated separately. To compare the calculations with experimental data, Hall-effect structures were fabricated and measured at temperatures ranging from 25 to 700 K, with hole sheet densities ranging from 2 to 6$\times10^{12}\;\text{cm}^{-2}$ and typical mobilities measured from 60 to 100 cm$^{2}$/(V$\cdot$s) at room temperature. Existing data from literature was also used, which spans sheet densities above 1$\times10^{13}\;\text{cm}^{-2}$. Our analysis indicates that for low sheet densities, surface impurity scattering by charged acceptors and surface roughness are not sufficient to account for the low mobility. Moreover, the experimental data suggests that long-range potential fluctuations exist at the diamond surface, and are particularly enhanced at lower sheet densities. Thus, we propose a second type of surface impurity scattering which is caused by disorder related to the C-H dipoles.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
