Optimal architecture for diamond-based wide-field thermal imaging
R. Tanos, W. Akhtar, S. Monneret, F. Favaro de Oliveira, G. Seniutinas, M. Munsch, P. Maletinsky, L. le Gratiet, I. Sagnes, A. Dréau, C. Gergely, V. Jacques, G.… 展开作者
R. Tanos, W. Akhtar, S. Monneret, F. Favaro de Oliveira, G. Seniutinas, M. Munsch, P. Maletinsky, L. le Gratiet, I. Sagnes, A. Dréau, C. Gergely, V. Jacques, G. Baffou, I. Robert-Philip
Nitrogen-Vacancy centers in diamond possess an electronic spin resonance that strongly depends on temperature, which makes them efficient temperature sensor with a sensitivity down to a few mK/$\sqrt{\rm Hz}$. However, the high thermal conductivity of the host diamond may strongly damp any temperature variations, leading to invasive measurements when probing local temperature distributions. In view of determining possible and optimal configurations for diamond-based wide-field thermal imaging, we here investigate, both experimentally and numerically, the effect of the presence of diamond on microscale temperature distributions. Three geometrical configurations are studied: a bulk diamond substrate, a thin diamond layer bonded on quartz and diamond nanoparticles dispersed on quartz. We show that the use of bulk diamond substrates for thermal imaging is highly invasive, in the sense that it prevents any substantial temperature increase. Conversely, thin diamond layers partly solve this issue and could provide a possible alternative for microscale thermal imaging. Dispersions of diamond nanoparticles throughout the sample appear as the most relevant approach as they do not affect the temperature distribution, although NV centers in nanodiamonds yield lower temperature sensitivities compared to bulk diamond.
Depth-Resolved Thermal Conductivity of HFCVD Diamond Films via Square-Pulsed Thermometry
School of Energy and Power Engineering, Huazhong University of Science and Technology（华中科技大学能源与动力工程学院）；Institute for Advanced Materials and Technology, University of Science and Technology Beijing（北京科技大学先进材料与技术研究院）；Shunde Graduate School, University of Science and Technology Beijing（北京科技大学顺德研究生院）；School of Energy and Power Engineering, Nanjing University of Science and Technology（南京理工大学能源与动力工程学院）
Monolithic integration of diverse crystalline thin films on diamond for near-junction thermal management
State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology（上海微系统与技术研究所集成电路材料国家重点实验室）；Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences（中国科学院大学物质科学与光电技术研究中心）；International Center for Quantum Materials, School of Physics, Peking University（北京大学物理学院量子材料研究院）；School of Science and Ministry of Industry and Information Technology Key Laboratory of Micro-Nano Optoelectronic Information System, Harbin Institute of Technology, Shenzhen（哈尔滨工业大学（深圳）理学院工业和信息化部微纳光电子信息系统重点实验室）；CETC Key Laboratory of Carbon-based Electronics, Nanjing Electronic Devices Institute（南京电子设备研究所中国电科碳基电子重点实验室）；Tsientang Institute for Advanced Study（杭州钱塘高等研究院）
Investigation of temperature dependence of magnetic properties of Cr$_2$O$_3$ thin film structure using a magnetic field imaging technique based on Nitrogen-Vacancy centres in diamond crystal
提出了一种基于金刚石晶体色心的磁场成像方法，并将其应用于薄膜结构。为了证明我们的设备的能力，我们已经使用它的微观尺度上的Cr $_2$ O $_3$薄膜结构以上和以下内尔温度的磁性能的表征。所获得的测量结果清楚地识别出在19 $^{\circ}$ C（低于Cr $_2$ O $_3$的Néel温度）下具有意想不到的抗磁性类似行为的Cr $_2$ O $_3$薄膜的磁性相变的检测。为了更好地了解薄膜产生的磁场，我们模拟了薄膜表面附近的磁场。我们还分析了光学检测的磁共振（ODMR）的配置文件，以确保测量的属性只与光学检测的磁共振的移位。我们展示了如何氮空位中心为基础的磁强计可以提供一个方便的平台，相变动力学和空间磁场分布的薄膜的研究，可以媲美其他广泛使用的测量技术。
Diamond quantum-sensing platform with integrated boron-doped diamond microwave antenna and thermometer
School of Engineering, Institute of Science Tokyo（东京科学大学工程学院）；Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science（物质材料研究机构纳米结构研究中心）；Department of Mechanical and Electrical Systems Engineering, Kyoto University of Advanced Science (KUAS)（京都先端科学大学机电系统工程系）；National Institutes for Quantum Science and Technology (QST)（量子科学技术研究开发机构）；Graduate School of Science and Technology, Hirosaki University（弘前大学理工研究院）
