arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1909.03255cs.CCcs.DM
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Hard properties with (very) short PCPPs and their applications

Omri Ben-Eliezer, Eldar Fischer, Amit Levi, Ron D. Rothblum

英文摘要:

We show that there exist properties that are maximally hard for testing, while still admitting PCPPs with a proof size very close to linear. Specifically, for every fixed $\ell$, we construct a property $\mathcal{P}^{(\ell)}\subseteq\{0,1\}^n$ satisfying the following: Any testing algorithm for $\mathcal{P}^{(\ell)}$ requires $Ω(n)$ many queries, and yet $\mathcal{P}^{(\ell)}$ has a constant query PCPP whose proof size is $O(n\cdot \log^{(\ell)}n)$, where $\log^{(\ell)}$ denotes the $\ell$ times iterated log function (e.g., $\log^{(2)}n = \log \log n$). The best previously known upper bound on the PCPP proof size for a maximally hard to test property was $O(n \cdot \mathrm{poly}\log{n})$. As an immediate application, we obtain stronger separations between the standard testing model and both the tolerant testing model and the erasure-resilient testing model: for every fixed $\ell$, we construct a property that has a constant-query tester, but requires $Ω(n/\log^{(\ell)}(n))$ queries for every tolerant or erasure-resilient tester.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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