双相位光栅X射线干涉测量中的样品相位梯度和条纹相移
Sample phase gradient and fringe phase shift in dual phase grating X-ray interferometry
摘要：
基于光栅的X射线相衬成像的关键任务之一是从测量的强度条纹位移中精确地恢复样品的局部相位梯度。为了在双相位光栅干涉测量中完成这一任务，需要知道两者之间的精确数学关系。基于拍频斑图形成机理，对样品产生的条纹位移进行了直观分析，推导出了样品相位梯度与条纹相移之间的关系式。这些公式也为双相位光栅干涉术提供了一种优化设计工具。
英文摘要：
One of the key tasks in grating based x-ray phase contrast imaging is to accurately retrieve local phase gradients of a sample from measured intensity fringe shifts. To fulfill this task in dual phase grating interferometry, one needs to know the exact mathematical relationship between the two. In this work, using intuitive analysis of the sample-generated fringe shifts based on the beat pattern formation mechanism, the authors derived the formulas relating sample's phase gradients to fringe phase shifts. These formulas provide also a design optimization tool for dual phase grating interferometry.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
