双相位光栅X射线干涉仪广义Lau条件的澄清
Clarification on Generalized Lau condition for X-ray interferometers based on dual phase gratings
摘要：
为了利用X射线管实现双相位光栅X射线干涉测量，需要结合吸收源光栅。为了获得良好的条纹可见度，源光栅的周期应受到严格的条件。在文献中，一些作者声称Talbot-Lau干涉术中的Lau条件可以从字面上转移到双相位光栅干涉术。在这项工作中，我们表明，这种说法在文学是不正确的。相反，通过一个直观的几何分析的条纹形成，我们推导出一个新的广义劳条件，提供了一个有用的设计工具，实现双相位光栅干涉。
英文摘要：
To implement dual phase grating x-ray interferometry with x-ray tubes, one needs to incorporate an absorbing source grating. In order to attain good fringe visibility, the period of a source grating should be subject to a stringent condition. In literature some authors claim that the Lau-condition in Talbot-Lau interferometry can be literally transferred to dual phase grating interferometry. In this work we show that this statement in literature is incorrect. Instead, through an intuitive geometrical analysis of fringe formation, we derived a new generalized Lau-condition that provides a useful design tool for implementation of dual phase grating interferometry.
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