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arXiv 1906.07263physics.ins-det
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X射线自由电子激光和同步辐射源的兆赫X射线显微术

Megahertz X-ray microscopy at X-ray Free-Electron Laser and Synchrotron sources

Patrik Vagovič, Tokushi Sato, Ladislav Mikeš, Grant Mills, Rita Graceffa, Frans Mattsson, Pablo Villanueva-Perez, Alexey Ershov, Tomáš Faragó, Jozef Uličný, Hen… 展开作者

Patrik Vagovič, Tokushi Sato, Ladislav Mikeš, Grant Mills, Rita Graceffa, Frans Mattsson, Pablo Villanueva-Perez, Alexey Ershov, Tomáš Faragó, Jozef Uličný, Henry Kirkwood, Romain Letrun, Rajmund Mokso, Marie-Christine Zdora, Margie P. Olbinado, Alexander Rack, Tilo Baumbach, Alke Meents, Henry N. Chapman, Adrian P. Mancuso

摘要:

我们展示了在欧洲X射线自由电子激光采样率为1.128 MHz的X射线相衬显微镜。我们已经应用这种方法的图像随机过程引起的光学激光入射到充满水的毛细管与微米尺度的空间分辨率。观察到了产生的高速水射流、空化在水和玻璃中的形成和湮灭以及玻璃的爆炸。XFEL和以前的同步加速器MHz显微镜之间的比较显示了优越的对比度和空间分辨率在XFEL的同步加速器。这项工作开辟了新的可能性的表征动态随机系统的纳秒到微秒的时间尺度上,兆赫率与物体速度高达每秒几公里,使用X射线自由电子激光源。

英文摘要:

We demonstrate X-ray phase contrast microscopy performed at the European X-ray Free-Electron Laser sampled at 1.128 MHz rate. We have applied this method to image stochastic processes induced by an optical laser incident on water-filled capillaries with micrometer scale spatial resolution. The generated high speed water jet, cavitation formation and annihilation in water and glass, as well as glass explosions are observed. The comparison between XFEL and previous synchrotron MHz microscopy shows the superior contrast and spatial resolution at the XFEL over the synchrotron. This work opens up new possibilities for the characterization of dynamic stochastic systems on nanosecond to microsecond time scales at megahertz rate with object velocities up to few kilometers per second using X-ray Free-Electron Laser sources.

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