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arXiv 1903.04079cond-mat.mtrl-sci
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从大块样品中提取的特定位错的全应变张量的纳米尺度成像

Nano-scale imaging of the full strain tensor of specific dislocations extracted from a bulk sample

Felix Hofmann, Nicholas W. Phillips, Suchandrima Das, Phani Karamched, Gareth M. Hughes, James O. Douglas, Wonsuk Cha, Wenjun Liu

摘要:

晶格缺陷在决定晶体材料的性能方面起着关键作用。探索控制它们相互作用的3D晶格应变仍然是一个挑战。布拉格相干衍射成像(BCDI)允许以纳米级3D分辨率测量应变。然而,它目前仅限于形成微晶的材料。在这里,我们介绍了一种新的技术,允许从散装材料的BCDI样品的制造。使用钨作为一个例子,我们表明,聚焦离子束(FIB)加工可以用来提取,从宏观晶体,微米级的BCDI样品含有特定的预选缺陷。为了解释实验数据,我们开发了一种新的基于位移梯度的多次反射BCDI分析。这允许从包含多个位错的样品中精确地恢复全晶格应变张量。这些新功能为BCDI作为研究复杂现实世界材料的显微镜工具打开了大门。

英文摘要:

Lattice defects play a key role in determining the properties of crystalline materials. Probing the 3D lattice strains that govern their interactions remains a challenge. Bragg Coherent Diffraction Imaging (BCDI) allows strain to be measured with nano-scale 3D resolution. However, it is currently limited to materials that form micro-crystals. Here we introduce a new technique that allows the manufacture of BCDI samples from bulk materials. Using tungsten as an example, we show that focussed ion beam (FIB) machining can be used to extract, from macroscopic crystals, micron-sized BCDI samples containing specific pre-selected defects. To interpret the experimental data, we develop a new displacement-gradient-based analysis for multi-reflection BCDI. This allows accurate recovery of the full lattice strain tensor from samples containing multiple dislocations. These new capabilities open the door to BCDI as a microscopy tool for studying complex real-world materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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