arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1902.07045cond-mat.mtrl-sciphysics.app-phphysics.optics
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STEM阴极射线发光的基本原理:样品几何形状和电子束能量对半导体发光的影响

Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors

Michael Stöger-Pollach, Kristyna Bukvisova, Sabine schwarz, Michal Kvapil, Tomas Samoril, Michal Horak

摘要:

阴极发光在扫描透射电子显微镜中引起了人们的兴趣,因为商业上可用的高效率检测系统的出现,如Gatan Vulcan或Attolight Mönch系统。在这项工作中,我们讨论了由高能电子束穿过半导体样品时所引起的光发射。我们发现,这是不可能的,直接解释的光谱的发射光的带间跃迁激发的电子束,因为切伦科夫效应和相关的光导模式以及过渡辐射正在改变的光谱。全内反射和随后的干涉效应分别根据样品形状和几何形状、样品厚度和光束能量改变光谱形状。以硅和砷化镓为测试材料,对这些参数进行了详细的研究。

英文摘要:

Cathodoluminescence has attracted interest in scanning transmission electron microscopy since the advent of commercial available detection systems with high efficiency, like the Gatan Vulcan or the Attolight Mönch system. In this work we discuss light emission caused by high-energy electron beams when traversing a semiconducting specimen. We find that it is impossible to directly interpret the spectrum of the emitted light to the inter-band transitions excited by the electron beam, because the Cerenkov effect and the related light guiding modes as well as transition radiation is altering the spectra. Total inner reflection and subsequent interference effects are changing the spectral shape dependent on the sample shape and geometry, sample thickness, and beam energy, respectively. A detailed study on these parameters is given using silicon and GaAs as test materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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