再论确定二维材料杨氏模量的屈曲计量方法
Revisiting the buckling metrology method to determine the Young's modulus of 2D materials
摘要：
测量二维材料的力学性能是一项艰巨的任务。虽然常规的电子和光学探测技术甚至适用于原子级薄的材料，但传统的机械测试不能直接应用。因此，需要开发新的机械测试技术。到目前为止，最普遍的方法需要微制造来创建自由悬浮的膜，使得它们的实施复杂且昂贵。在这里，我们重温一个简单而强大的技术来测量薄膜的机械性能。不需要制造自由悬挂结构的屈曲计量方法用于确定厚度范围为3至10层的几种过渡金属二硫属化物（MoS2、MoSe2、WS2和WSe2）的杨氏模量。我们严格比较所获得的杨氏模量和它们的不确定性的值，发现这种简单的技术提供的结果，这是在良好的协议与使用其他高度复杂的测试方法报告。通过比较文献中报道的不同方法所需的成本，复杂性和时间，屈曲计量方法具有一定的优势，使其成为一种有趣的2D材料力学测试工具。
英文摘要：
Measuring the mechanical properties of two-dimensional materials is a formidable task. While regular electrical and optical probing techniques are suitable even for atomically thin materials, conventional mechanical tests cannot be directly applied. Therefore, new mechanical testing techniques need to be developed. Up to now, the most widespread approaches require micro-fabrication to create freely suspended membranes, rendering their implementation complex and costly. Here, we revisit a simple yet powerful technique to measure the mechanical properties of thin films. The buckling metrology method, that does not require the fabrication of freely suspended structures, is used to determine the Young's modulus of several transition metal dichalcogenides (MoS2, MoSe2, WS2 and WSe2) with thicknesses ranging from 3 to 10 layers. We critically compare the obtained values for the Young's modulus and their uncertainty, finding that this simple technique provides results, which are in good agreement with those reported using other highly sophisticated testing methods. By comparing the cost, complexity and time required for the different methods reported in the literature, the buckling metrology method presents certain advantages that makes it an interesting mechanical test tool for 2D materials.
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