拓扑材料的自旋和角分辨光电发射
Spin- and angle-resolved photoemission on topological materials
摘要：
自旋和角度分辨光电发射拓扑材料的历史回顾，针对读者谁是新的领域或谁希望获得在该领域的活动的概述。主要焦点在于拓扑绝缘体，但也外尔和其他半金属将讨论。此外，将解释为什么从自旋极化状态测量的自旋极化应该总是加起来为100%，以及自旋干涉效应如何影响测量的自旋织构。
英文摘要：
A historical review of spin- and angle-resolved photoemission on topological materials is presented, aimed at readers who are new to the field or who wish to obtain an overview of the activities in the field. The main focus lies on topological insulators, but also Weyl and other semimetals will be discussed. Further it will be explained why the measured spin polarisation from a spin polarised state should always add up to 100% and how spin interference effects influence the measured spin texture.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
