arXivDaily arXiv每日学术速递 周一至周五更新
北美退伍军人节(Veterans Day),12 日无更新
arXiv 1808.09233cs.SE
收藏

Defects4J基准测试中的偶然正确性

Coincidental Correctness in the Defects4J Benchmark

Rawad Abou Assi, Chadi Trad, Marwan Maalouf, Wes Masri

摘要:

当有缺陷的程序尽管执行了其中的缺陷但仍产生正确的输出时,就会出现巧合正确性(CC)。研究人员已经认识到巧合正确性的负面影响,作者之前进行了一项研究,证明了它在测试套件中的普遍性。然而,该研究仅限于系统测试和植入人工缺陷的小型受试者。在本文中,我们进行了更广泛的研究CC,解决了以下研究问题的背景下,缺陷4J基准:RQ 1:CC普遍存在缺陷4J?RQ 2:CC是否受到Defects4J中测试级别的影响?RQ 3:CC测试是否会在Defects4J中诱导特殊的感染途径?RQ4:感染可能在车内或车外的方法无效?....

英文摘要:

Coincidental correctness (CC) arises when a defective program produces the correct output despite the fact that the defect within was exercised. Researchers have recognized the negative impact of coincidental correctness, and the authors have previously conducted a study demonstrating its prevalence in test suites. However, that study was limited to system tests and small subjects seeded with artificial defects. In this paper, we conduct a wider scope study of CC that addresses the following research questions in the context of the Defects4J benchmark: RQ1: Is CC prevalent in Defects4J? RQ2: Is CC affected by the testing levels in Defects4J? RQ3: Do CC tests induce peculiar infection paths in Defects4J? RQ4: Are the infections likely to be nullified within or outside the buggy method? ....

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑