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arXiv 1806.01475cond-mat.mtrl-sci
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反铁磁双层膜Cr2O3/Ta中反常霍尔效应引起的自旋霍尔磁电阻

Anomalous Hall effect induced spin Hall magnetoresistance in an antiferromagnetic Cr2O3/Ta bilayer

Yang Ji, J. Miao, K. K. Meng, X. G. Xu, J. K. Chen, Y. Wu, Y. Jiang

摘要:

在Cr2 O3/Ta结构中观察到自旋霍尔磁电阻(SMR)和反常霍尔效应(AHE)。研究了Cr_2 O_3/Ta双层膜的结构和表面形貌。纵向和横向电阻测量的温度依赖性证实了Cr2 O3/Ta结构中SMR和AHE信号之间的关系。通过温度相关的磁电阻测量,揭示了Cr_2O_3/Ta结构中SMR的物理起源,并证实了AHE产生的自旋电流对SMR的贡献。Cr_2O_3/Ta双层膜中SMR和AHE的关系可能是由Cr_2O_3膜中的体反铁磁有序引起的边界磁化引起的。

英文摘要:

The spin Hall magnetoresistance (SMR) and anomalous Hall effect (AHE) are observed in a Cr2O3/Ta structure. The structural and surface morphology of Cr2O3/Ta bilayers have been investigated. Temperature dependence of longitudinal and transverse resistances measurements confirm the relationship between SMR and AHE signals in Cr2O3/Ta structure. By means of temperature dependent magnetoresistance measurements, the physical origin of SMR in the Cr2O3/Ta structure is revealed, and the contribution to the SMR from the spin current generated by AHE has been proved. The so-called boundary magnetization due to the bulk antiferromagnetic order in Cr2O3 film may be responsible for the relationship of SMR and AHE in the Cr2O3/Ta bilayer.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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