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arXiv 1804.08786cond-mat.mtrl-scicond-mat.mes-hall
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具有超低总阻尼的$\text{Co}_{25}\text{Fe}_{75}$薄膜

$\text{Co}_{25}\text{Fe}_{75}$ Thin Films with Ultralow Total Damping

Eric R. J. Edwards, Hans T. Nembach, Justin M. Shaw

摘要:

我们测量了用直流磁控溅射法生长的$\text{Co}_{25}\text{Fe}_{75}$薄膜的动态特性。使用铁磁共振光谱,我们证明了一个超低的总阻尼参数在面外配置< 0.0013,而对于面内配置,我们发现一个最小的总阻尼< 0.0020。在这两种情况下,我们观察到低不均匀的线宽加宽宏观薄膜。我们观察到一个最小的全宽半最大线宽为1 mT在10 GHz的谐振频率为12 nm厚的膜。我们表征这些薄膜的形态和结构作为种子层组合的函数,并发现大的变化的定性行为的面内线宽与谐振频率。最后,我们使用依赖于波矢的布里渊光散射光谱来表征自旋波色散在波矢高达23 $μ\text{m}^{-1}$。

英文摘要:

We measure the dynamic properties of $\text{Co}_{25}\text{Fe}_{75}$ thin films grown by dc magnetron sputtering. Using ferromagnetic resonance spectroscopy, we demonstrate an ultralow total damping parameter in the out-of-plane configuration of < 0.0013, whereas for the in-plane configuration we find a minimum total damping of < 0.0020. In both cases, we observe low inhomogeneous linewidth broadening in macroscopic films. We observe a minimum full-width half-maximum linewidth of 1 mT at 10 GHz resonance frequency for a 12 nm thick film. We characterize the morphology and structure of these films as a function of seed layer combinations and find large variation of the qualitative behavior of the in-plane linewidth vs. resonance frequency. Finally, we use wavevector-dependent Brillouin light scattering spectroscopy to characterize the spin-wave dispersion at wave vectors up to 23 $μ\text{m}^{-1}$.

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