用宽视场金刚石显微镜表征微波器件
Microwave device characterisation using a widefield diamond microscope
摘要：
依赖于微波电路的设备构成了许多经典和新兴量子技术的基石。一个能力，提供原位，非侵入性和直接成像的微波场以上的设备将是一个强大的工具，其功能和故障分析。在这项工作中，我们建立在最近的成就，在磁力测量使用合奏的氮空位中心在金刚石，提出了一个宽场微波显微镜与几微米分辨率超过毫米级的视野，130 nT/平方赫兹的微波幅度灵敏度，48分贝的动态范围，和亚毫秒的时间分辨率。我们用我们的显微镜成像微波场几微米以上的微波电路组件的范围，并验证了一种新的原子芯片设计。我们的研究结果开辟了高通量的表征和调试复杂的，多组分的微波器件，包括设备操作的实时探索的方式。
英文摘要：
Devices relying on microwave circuitry form a cornerstone of many classical and emerging quantum technologies. A capability to provide in-situ, noninvasive and direct imaging of the microwave fields above such devices would be a powerful tool for their function and failure analysis. In this work, we build on recent achievements in magnetometry using ensembles of nitrogen vacancy centres in diamond, to present a widefield microwave microscope with few-micron resolution over a millimeter-scale field of view, 130nT/sqrt-Hz microwave amplitude sensitivity, a dynamic range of 48 dB, and sub-ms temporal resolution. We use our microscope to image the microwave field a few microns above a range of microwave circuitry components, and to characterise a novel atom chip design. Our results open the way to high-throughput characterisation and debugging of complex, multi-component microwave devices, including real-time exploration of device operation.
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