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arXiv 1802.04556cond-mat.mtrl-sci
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辐照缺陷空位扩散退火的混合平均场和实空间模型

Hybrid mean field and real space model for vacancy diffusion-mediated annealing of radiation defects

I. Rovelli, S. L. Dudarev, A. P. Sutton

摘要:

在聚变或先进的裂变反应堆中,高能中子会在结构部件材料中诱导形成扩展的缺陷团簇,从而随着时间的推移降低其性能。这种损伤可以通过热退火处理部分恢复。因此,对于聚变和先进裂变核能系统的设计和运行,估计和预测任意结构缺陷团簇的退火时间尺度是至关重要的。在我们以前的论文[I。Rovelli,S. L. Dudarev和A. P. Sutton,J. Mech.Phys.Solids 103,121(2017)],我们扩展了Gu,Xiang等人[Y. Gu,Y. Xiang,S. S. Quek和D. J.Srolovitz,J.Mech.Phys.Solids 83,319(2015)]中的方法来计算弯曲位错的爬升,以包括空穴和空位簇的蒸发和生长,并考虑自由表面的影响。在这项工作中,我们进一步发展这个模型,包括辐射缺陷的影响,低于实验检测限,通过平均场的方法,再加上一个明确的治疗离散缺陷集群分布在真实空间中的演变。我们发现,随机分布的小缺陷屏幕扩散较大的离散集群之间的相互作用。耦合系统的演化自洽建模。我们还模拟了缺陷在无限横向延伸的薄膜的演变,使用Ewald求和屏蔽Yukawa型扩散传播。

英文摘要:

In a fusion or advanced fission reactor, high energy neutrons induce the formation of extended defect clusters in structural component materials, degrading their properties over time. Such damage can be partially recovered via a thermal annealing treatment. Therefore, for the design and operation of fusion and advanced fission nuclear energy systems it is critical to estimate and predict the annealing timescales for arbitrary configurations of defect clusters. In our earlier paper [I. Rovelli, S. L. Dudarev, and A. P. Sutton, J. Mech. Phys. Solids 103, 121 (2017)] we extended the Green function formulation by Gu, Xiang et al. [Y. Gu, Y. Xiang, S. S. Quek, and D. J. Srolovitz, J. Mech. Phys. Solids 83, 319 (2015)] for the climb of curved dislocations, to include the evaporation and growth of cavities and vacancy clusters, and take into account the effect of free surfaces. In this work, we further develop this model to include the effect of radiation defects that are below the experimental detection limit, via a mean field approach coupled with an explicit treatment of the evolution of discrete defect clusters distributed in real space. We show that randomly distributed small defects screen diffusive interactions between larger discrete clusters. The evolution of the coupled system is modelled self-consistently. We also simulate the evolution of defects in an infinite laterally extended thin film, using the Ewald summation of screened Yukawa-type diffusive propagators.

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