氖中超短X射线脉冲的正常俄歇过程
Normal Auger processes with ultrashort x-ray pulses in Neon
摘要：
现代X射线源能够产生相干X射线脉冲，其脉冲持续时间与原子和分子的芯-空穴状态的特征寿命的量级相同。这些脉冲使俄歇衰变过程中的核心空穴人口的操纵，修改电子光谱的线形。在这项工作中，我们提出了一个理论模型来研究霓虹灯的这些影响。我们确定的俄歇光电子符合光谱由于脉冲的持续时间和强度的影响。对所有光电子能量积分的俄歇电子谱恢复了正常的俄歇线型。
英文摘要：
Modern x-ray sources enable the production of coherent x-ray pulses with a pulse duration in the same order as the characteristic lifetimes of core-hole states of atoms and molecules. These pulses enable the manipulation of the core-hole population during Auger decay processes, modifying the lineshape of the electron spectra. In this work, we present a theoretical model to study those effects in Neon. We identify effects in the Auger-photoelectron coincidence spectrum due to the duration and intensity of the pulses. The normal Auger line-shape is recovered in Auger electron spectrum integrated over all photoelectron energies.
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