YBa_2Cu_3O_6 +d中的时效效应在低速淬火样品上进行了研究，与其他类似的研究中的高速淬火样品进行了检查。在调查的框架内，XPS分析已进行淬火后存储的样品为指定的时间t和YBa 2Cu 3 O 6 +d晶格参数a，b，和c的详细实验依赖性的d和t已经得到。该制度的低速淬火的结果在一个三倍的时效效应的大小增加。c（d; t）依赖性的特殊情况可以用二阶多项式很好地描述，对于不同的t应用不同的系数。行为c已被解释的基础上的CuO 2和CuO d结构面之间的库仑相互作用的一个简单的模型，其中发生的空穴电荷转移从CuO d到CuO 2提供的标准水平的Tc在YBa 2Cu 3 O 6 +d（这个水平的特点是由93 K的最大Tc在d = 0.9）。结果表明，c（d; t）依赖性是评估YBa_2Cu_3O_6 +d中空穴浓度的一个很好的替代方法。通过分析c（d; t）的实验依赖性以及XPS所得到的Cu-O对中空穴局域化的数据，对所观察到的时效效应的性质作出了结论。后者可能与室温下YBa_2Cu_3O_（6 +d）基面中Cu的3d 9 L-1电子组态向Cu 3d 8电子组态的转变有关。
英文摘要：
The aging effects in YBa2Cu3O6+d have been investigated on the low-speed quenched samples in contrast to other similar studies where the high-speed quenched samples were examined. In the framework of the investigation, XPS analysis has been conducted for the samples stored after quenching for the specified times t and a detailed experimental dependence of the YBa2Cu3O6+d lattice parameters a, b, and c on both d and t has been obtained. The regime of low-speed quenching results in a threefold increase in the aging effect magnitude. Particular cases of the c(d; t) dependence are well described by a second-order polynomial with applying different coefficients for different t. The behavior c has been explained on the basis of a simple model of the Coulomb interaction between the CuO2 and CuOd structural planes, in which the hole charge transfer from CuOd to CuO2 takes place providing the standard level of Tc in YBa2Cu3O6+d (this level is characterized by a maximum Tc of 93 K at d = 0.9). It has been demonstrated that the c(d; t) dependence is a good alternative to assessing the hole concentration in YBa2Cu3O6+d. By analyzing the c(d; t) experimental dependence as well as the data on the hole localization in the pairs Cu-O obtained by XPS, the authors have made a conclusion about the nature of observed aging effects. The latter are likely to be related to the transition of the Cu 3d9L-1 electron configuration to Cu 3d8 for copper in the basal plane of YBa2Cu3O6+d at RT.
Effect of Temperature, Pressure and Aging time on the Relaxation Dynamics of Bi0.9Gd0.1Fe0.9Mn0.1O3 System: Direct Evidence of Glassy State and Pressure Induced Relaxor Behavior
弛豫铁电体（PbMn $_{1/3}$ Nb $_{2/3}$ O $_3$）$_{1-x}$（PbTiO $_3$）$_{x}$，$x=0.1$，（PMN/PT（90/10））表现出几种复杂的时效行为。就在敏感性峰值之下，有一种状态表现出年轻化，但几乎没有记忆。在较低的温度下，有一个政权，主要是累积老化，预计简单的域增长。在更低的温度下，有一个既有恢复活力又有记忆的机制，让人想起旋转眼镜。PMN/PT（88/12）也被发现表现出一些这些老化制度。这种定性的老化行为让人想起在重入铁磁体中所看到的，重入铁磁体在较低温度下表现出从畴生长铁磁制度到重入自旋玻璃制度的交叉。这些惊人的相似之处表明，在PMN/PT（90/10）之间的竞争的铁电相关形成的畴生长制度与玻璃相关形成的自旋玻璃制度。PMN/PT（90/10）也被发现表现出频率老化时间缩放的时间依赖性的一部分，温度为260 K及以下的相位敏感性。还报道了老化效应对热循环和场扰动的稳定性。
