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arXiv 1708.04752cond-mat.mes-hall
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AlN/GaN/AlN量子阱中电子-空穴双层系统的太赫兹光谱

Terahertz spectroscopy of an electron-hole bilayer system in AlN/GaN/AlN quantum wells

H. Condori Quispe, S. M. Islam, S. Bader, A. Chanana, K. Lee, R. Chaudhuri, A. Nahata, H. G. Xing, D. Jena, B. Sensale-Rodriguez

摘要:

我们描述了应变AlN/GAN/AlN量子阱中载流子的纳米级输运动力学的研究:一个电子-空穴双层电荷系统,两个电荷层之间的输运性质有很大的差异。从电子能带图分析,空间分离的二维电子和空穴电荷层的存在下,预测在相对的界面。由于这些电荷层在太赫兹频率下表现出不同的光谱特征,太赫兹和远红外光谱的组合使我们能够提取(a)对总电导率的单独贡献,以及(b)每层中电荷载流子的有效散射率。此外,通过比较直流和太赫兹提取的电导率水平,我们能够确定结构缺陷影响电荷传输的程度。我们的研究结果表明,(i)一个非统一的霍尔因子和(ii)相当大的贡献的整体电导率的空穴,导致在霍尔效应测量的表观迁移率较低。总的来说,我们的工作表明,太赫兹光谱是一种合适的技术,用于研究双层电荷系统的层之间的传输特性有很大的差异,如在三族氮化物半导体量子阱。

英文摘要:

We describe studies on the nanoscale transport dynamics of carriers in strained AlN/GaN/AlN quantum wells: an electron-hole bilayer charge system with large difference in transport properties between the two charge layers. From electronic band diagram analysis, the presence of spatially separated two-dimensional electron and hole charge layers is predicted at opposite interfaces. Since these charge layers exhibit distinct spectral signatures at terahertz frequencies, a combination of terahertz and far-infrared spectroscopy enables us to extract (a) individual contributions to the total conductivity, as well as (b) effective scattering rates for charge-carriers in each layer. Furthermore, by comparing direct-current and terahertz extracted conductivity levels, we are able to determine the extent to which structural defects affect charge transport. Our results evidence that (i) a non-unity Hall-factor and (ii) the considerable contribution of holes to the overall conductivity, lead to a lower apparent mobility in Hall-effect measurements. Overall, our work demonstrates that terahertz spectroscopy is a suitable technique for the study of bilayer charge systems with large differences in transport properties between layers, such as quantum wells in III-Nitride semiconductors.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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