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arXiv 1708.04508cond-mat.mtrl-sci
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半导体缺陷磁光数据的第一性原理预测:4 H- SiC中双空位缺陷的情况

First principles predictions of magneto-optical data for semiconductor defects: the case of divacancy defects in 4H-SiC

Joel Davidsson, Viktor Ivády, Rickard Armiento, N. T. Son, Adam Gali, Igor Abrikosov

摘要:

半导体中磁光活性单点缺陷的研究和设计由于其在量子比特和单光子发射器应用中的潜力而迅速发展。详细了解候选缺陷的性质对于这些应用是必不可少的,并且需要识别缺陷的微观构型和电子结构。多组分半导体通常具有两种或更多种非等效的点缺陷配置。这些配置通常表现出类似的电子结构和基本功能,然而,它们在细节上不同,这在考虑单个缺陷应用时非常重要。因此,识别点缺陷的非等效配置对于成功的单缺陷操作和应用是必不可少的。一个有前途的方法来识别缺陷是通过比较实验测量和第一原理计算的结果。我们调查的可能性,以产生准确的从头算数据的零声子线和超精细耦合参数,需要系统的量子位搜索。我们专注于可能使用的双空位缺陷的量子位在4 H-SiC的相关属性。我们提供了一个决定性的识别4 H-SiC中的双空位配置和澄清4 H-SiC双空位零声子光致发光线的先前预测的差异。

英文摘要:

Study and design of magneto-optically active single point defects in semiconductors are rapidly growing fields due to their potential in quantum bit and single photon emitter applications. Detailed understanding of the properties of candidate defects is essential for these applications, and requires the identification of the defects microscopic configuration and electronic structure. Multi-component semiconductors often host two or more non-equivalent configurations of point defects. These configurations generally exhibit similar electronic structure and basic functionalities, however, they differ in details that are of great importance whenever single defect applications are considered. Identification of non-equivalent configurations of point defects is thus essential for successful single defect manipulation and application. A promising way to identify defects is via comparison of experimental measurements and results of first-principle calculations. We investigate a possibility to produce accurate ab initio data for zero-phonon lines and hyperfine coupling parameters that are required for systematic quantum bit search. We focus on properties relevant for the possible use of the divacancy defect in quantum bits in 4H-SiC. We provide a decisive identification of divacancy configurations in 4H-SiC and clarify differences in prior predictions of 4H-SiC divacancy zero-phonon photoluminescence lines.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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