X射线傅立叶重叠关联显微术
X-ray Fourier ptychographic microscopy
摘要：
根据Zheng等人（2013）在可见光范围内的傅立叶重叠关联显微镜（FPM）的最新发展，我们提出了一种适用于硬X射线的方法。FPM采用重叠关联重建将一系列低分辨率、宽视场图像合并成一幅高分辨率图像。在X射线范围内，这开启了克服现有X射线透镜的有限数值孔径的可能性。此外，数字波前校正（DWC）可用于表征和校正透镜缺陷。考虑到X射线透镜可达到的衍射极限（低于100 nm），X射线傅立叶重叠关联显微镜（XFPM）应该能够达到10 nm范围内的分辨率。
英文摘要：
Following the recent developement of Fourier ptychographic microscopy (FPM) in the visible range by Zheng et al. (2013), we propose an adaptation for hard x-rays. FPM employs ptychographic reconstruction to merge a series of low-resolution, wide field of view images into a high-resolution image. In the x-ray range this opens the possibility to overcome the limited numerical aperture of existing x-ray lenses. Furthermore, digital wave front correction (DWC) may be used to charaterize and correct lens imperfections. Given the diffraction limit achievable with x-ray lenses (below 100 nm), x-ray Fourier ptychographic microscopy (XFPM) should be able to reach resolutions in the 10 nm range.
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