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arXiv 1607.04575physics.optics
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40 nm带宽电光双梳干涉测量

Electro-optic dual-comb interferometry over 40-nm bandwidth

Vicente Duran, Peter A. Andrekson, Victor Torres-Company

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摘要：

双梳干涉测量是一种使用两个激光频率梳以逐线方式检索复杂光谱的测量技术。这种技术可以实现与电光频率梳，提供内在的相互相干，高采集速度和灵活的重复率操作。在双梳干涉测量中，这种频率梳的操作的挑战是其有限的光学带宽。在这里，我们使用相干光谱展宽，并在整个电信C波段（200线覆盖~ 40 nm，在10微秒内测量，每谱线100信噪比）演示电光双梳干涉。这些结果提供了新的前景，电光双梳干涉作为一个合适的技术，高速宽带计量，例如在光学相干层析成像或相干拉曼显微镜。

英文摘要：

Dual-comb interferometry is a measurement technique that uses two laser frequency combs to retrieve complex spectra in a line-by-line basis. This technique can be implemented with electro-optic frequency combs, offering intrinsic mutual coherence, high acquisition speed and flexible repetition-rate operation. A challenge with the operation of this kind of frequency comb in dual-comb interferometry is its limited optical bandwidth. Here, we use coherent spectral broadening and demonstrate electro-optic dual-comb interferometry over the entire telecommunications C band (200 lines covering ~ 40 nm, measured within 10 microseconds at 100 signal-to-noise ratio per spectral line). These results offer new prospects for electro-optic dual-comb interferometry as a suitable technology for high-speed broadband metrology, for example in optical coherence tomography or coherent Raman microscopy.

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