空间分辨小角中子散射白束远场中子干涉仪的演示
Demonstration of a white beam far-field neutron interferometer for spatially resolved small angle neutron scattering
摘要：
我们提供的第一个演示，中子远场干涉仪可以用来测量样品的微观结构。干涉仪是基于先前在硬X射线和可见光实验中实现的两个相位调制光栅的莫尔图案。该干涉仪的自相关长度，以及因此被探测的微结构长度尺度，与光栅间距和中子波长成比例，并且对于一对光栅可以在几个数量级上变化。我们比较我们的测量结果的变化，从单分散样品的可见度与计算显示合理的协议。远场中子干涉仪的潜在优点包括多色光束中的高条纹可见度（超过30%），不需要吸收光栅来分辨干涉条纹，以及通过改变光栅间距或中子波长来测量具有宽波长范围和单组光栅的100 nm至10 \mum的长度尺度范围内的微结构的能力。
英文摘要：
We provide the first demonstration that a neutron far-field interferometer can be employed to measure the microstructure of a sample. The interferometer is based on the moiré pattern of two phase modulating gratings which was previously realized in hard x-ray and visible light experiments. The autocorrelation length of this interferometer, and hence the microstructure length scale that is probed, is proportional to the grating spacing and the neutron wavelength, and can be varied over several orders of magnitude for one pair of gratings. We compare our measurements of the change in visibility from monodisperse samples with calculations which show reasonable agreement. The potential advantages of a far-field neutron interferometer include high fringe visibility in a polychromatic beam (over 30 %), no requirement for an absorbing grating to resolve the interference fringes, and the ability to measure the microstructure in the length scale range of 100 nm to 10 \mum by varying either the grating spacing or neutron wavelength with a broad wavelength range and single set of gratings.
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