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arXiv 1602.09045cond-mat.mtrl-sci
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分子束外延$_2$ Te $_{3-x}$ Se $_x$层中化学有序的动力学限制

Kinetic limitation of chemical ordering in Bi$_2$Te$_{3-x}$Se$_x$ layers grown by molecular beam epitaxy

S. Schreyeck, K. Brunner, A. Kirchner, U. Bass, S. Grauer, C. Schumacher, C. Gould, G. Karczewski, J. Geurts, L. W. Molenkamp

摘要:

研究了Si衬底上分子束外延生长的Bi $_2$ Te $_{3-x}$ Se $_x$的化学有序性。我们生产的薄膜在整个组成范围从x = 0到3,并确定其材料特性,使用能量色散X射线光谱,X射线衍射和拉曼光谱。通过拟合的动力学生长模型的参数,这些结果,我们得到了一致的描述在微观水平上的增长。我们的主要发现是,尽管Se在中心层中的掺入比Te的掺入可能性大得多,但生长过程的动力学阻止了完全有序的Te-Bi-Se-Bi-Te层的形成。实际上,Bi $_2$ Te $_2$ Se $_1$的中心层中的Se浓度即使在理想生长条件下也达到仅$\approx$ 75%的最大值。我们的工作的第二个发现是,0 0 12和0 0 6的X射线反射的强度比作为一个实验上可访问的定量测量这些薄膜的有序度。

英文摘要:

We study the chemical ordering in Bi$_2$Te$_{3-x}$Se$_x$ grown by molecular beam epitaxy on Si substrates. We produce films in the full composition range from x = 0 to 3, and determine their material properties using energy dispersive X-ray spectroscopy, X-ray diffraction and Raman spectroscopy. By fitting the parameters of a kinetic growth model to these results, we obtain a consistent description of growth at a microscopic level. Our main finding is that despite the incorporation of Se in the central layer being much more probable than that of Te, the formation of a fully ordered Te-Bi-Se-Bi-Te layer is prevented by kinetic of the growth process. Indeed, the Se concentration in the central layer of Bi$_2$Te$_2$Se$_1$ reaches a maximum of only $\approx$ 75% even under ideal growth conditions. A second finding of our work is that the intensity ratio of the 0 0 12 and 0 0 6 X-ray reflections serves as an experimentally accessible quantitative measure of the degree of ordering in these films.

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