Speedster-EXD--一种新型事件驱动混合CMOS X射线探测器
The Speedster-EXD- A New Event-Driven Hybrid CMOS X-ray Detector
摘要：
Speedster-EXD是一款全新的64 x64像素、40 $μ$ m像素间距、100 $μ$ m耗尽深度混合CMOS X射线探测器（HCD），能够仅读出包含事件电荷的像素，从而实现快速有效帧速率。可以指定全局电荷阈值，并且标记并读出包含高于该阈值的电荷的像素。Speedster探测器还设计了其他先进的像素内特性以提高性能，包括消除像素间电容串扰（IPC）的低噪声、高增益CTIA放大器，以及用于降低复位噪声的像素内相关双采样（CDS）减法。我们在Speedster-EXD探测器上测量到的最佳能量分辨率在5.89 keV为206 eV（3.5%），在1.49 keV为172 eV（10.0%）。测量到四个相邻像素的平均IPC为0.25 $\pm$ 0.2%（即与零一致）。像素到像素的增益变化被测量为0.80 $\pm$ 0.03%，并且应用蒙特卡罗模拟来更好地表征对能量分辨率的贡献。
英文摘要：
The Speedster-EXD is a new 64x64 pixel, 40 $μ$m pixel pitch, 100 $μ$m depletion depth hybrid CMOS X-ray detector (HCD) with the capability of reading out only those pixels containing event charge, thus enabling fast effective frame rates. A global charge threshold can be specified, and pixels containing charge above this threshold are flagged and read out. The Speedster detector has also been designed with other advanced in-pixel features to improve performance, including a low-noise, high-gain CTIA amplifier that eliminates interpixel capacitance crosstalk (IPC), and in-pixel Correlated Double Sampling (CDS) subtraction to reduce reset noise. We measure the best energy resolution on the Speedster-EXD detector to be 206 eV (3.5 %) at 5.89 keV and 172 eV (10.0 %) at 1.49 keV. The average IPC to the four adjacent pixels is measured to be 0.25 $\pm$ 0.2 % (i.e. consistent with zero). The pixel-to-pixel gain variation is measured to be 0.80 $\pm$ 0.03 %, and a Monte Carlo simulation is applied to better characterize the contributions to the energy resolution.
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