用外差开尔文探针力显微镜快速、高分辨率测量空气中的表面电位
Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy
摘要：
开尔文探针力显微镜（KPFM）采用原子力显微镜在纳米尺度上测量表面的电势。在这里，我们证明，外差KPFM使扫描速率的几帧每分钟在空气中，并同时保持空间分辨率和电压灵敏度相媲美的调频KPFM，目前的空间分辨率标准。两个常见的类的地形耦合文物被证明是可以避免的H-KPFM。还介绍了H-KPFM的第二种实现方式，其中通过第一悬臂梁谐振放大电压信号以增强灵敏度。H-KPFM的增强的时间分辨率可以实现许多动态过程的成像，例如电致变色切换、相变和器件退化（电池、太阳能等），其发生在数秒至数分钟内，并且涉及纳米长度的电势变化。
英文摘要：
Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure electric potential on surfaces at nanometer length scales. Here we demonstrate that Heterodyne-KPFM enables scan rates of several frames per minute in air, and concurrently maintains spatial resolution and voltage sensitivity comparable to frequency-modulation KPFM, the current spatial resolution standard. Two common classes of topography-coupled artifacts are shown to be avoidable with H-KPFM. A second implementation of H-KPFM is also introduced, in which the voltage signal is amplified by the first cantilever resonance for enhanced sensitivity. The enhanced temporal resolution of H-KPFM can enable the imaging of many dynamic processes, such as such as electrochromic switching, phase transitions, and device degredation (battery, solar, etc.), which take place over seconds to minutes and involve changes in electric potential at nanometer lengths.
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