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arXiv 1507.04825math.OC
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高阶度量次正则性及其应用

Higher-Order Metric Subregularity and Its Applications

Boris Mordukhovich, Wei Ouyang

摘要:

本文研究了有限维和无限维集值映射的度量次正则性和任意正序$q$的强次正则性。虽然这些概念已经被研究并应用于$q=1$和-在较小的程度上-用于$q\in(0,1)$,但没有结果可用于$q>1$病例。我们推导出这些概念的次梯度映射的特征,小扰动下的灵敏度分析,并提供应用程序的收敛速度的牛顿型方法求解广义方程。

英文摘要:

This paper is devoted to the study of metric subregularity and strong subregularity of any positive order $q$ for set-valued mappings in finite and infinite dimensions. While these notions have been studied and applied earlier for $q=1$ and---to a much lesser extent---for $q\in(0,1)$, no results are available for the case $q>1$. We derive characterizations of these notions for subgradient mappings, develop their sensitivity analysis under small perturbations, and provide applications to the convergence rate of Newton-type methods for solving generalized equations.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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