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arXiv 1506.08718cond-mat.mtrl-sci
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(Ga,Mn)(Bi,As)外延层中失配应变对其磁性和磁输运性质的影响

Effect of Misfit Strain in (Ga,Mn)(Bi,As) Epitaxial Layers on their Magnetic and Magneto-Transport Properties

K. Levchenko, T. Andrearczyk, J. Z. Domagala, J. Sadowski, L. Kowalczyk, M. Szot, T. Figielski, T. Wosinski

AI总结:

本文研究了失配应变对(Ga,Mn)(Bi,As)外延层磁性和磁输运性质的影响,发现退火可提高空穴浓度和居里温度。

摘要:

研究了在GaAs衬底或(In,Ga)As缓冲层上外延生长的(Ga,Mn)(Bi,As)四元稀磁半导体层中失配应变对其磁性和磁输运性质的影响。高分辨率X射线衍射用于表征层的结构质量和失配应变,证明这些层分别完全应变于GaAs衬底或(In,Ga)As缓冲层,处于压应变或张应变状态。通过磁光克尔效应磁强计和低温磁输运测量,考察了这些层的铁磁居里温度和磁晶各向异性。研究表明,层的生长后退火处理可提高层中的空穴浓度和居里温度。

英文摘要:

Effect of misfit strain in the layers of (Ga,Mn)(Bi,As) quaternary diluted magnetic semiconductor, epitaxially grown on either GaAs substrate or (In,Ga)As buffer, on their magnetic and magneto-transport properties has been investigated. High-resolution X-ray diffraction, applied to characterize the structural quality and misfit strain in the layers, proved that the layers were fully strained to the GaAs substrate or (In,Ga)As buffer under compressive or tensile strain, respectively. Ferromagnetic Curie temperature and magnetocrystalline anisotropy of the layers have been examined by using magneto-optical Kerr effect magnetometry and low-temperature magneto-transport measurements. Post-growth annealing treatment of the layers has been shown to enhance the hole concentration and Curie temperature in the layers.

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