拓扑计量学及其在光学位置传感中的应用
Topological metrology and its application to optical position sensing
摘要：
我们激励计量方案的基础上拓扑奇点作为一种方式来建立对系统变形的鲁棒性。特别是，我们涉及的参考设置的拓扑奇点的测量输出的拓扑系统。作为示例，我们讨论光学纳米位置感测（i）使用平衡光电检测器和象限光电检测器，以及（ii）更一般的基于图像的方案。在这两种情况下，参考设置是对应于从散射场强度分布构建的输出空间中的拓扑奇点的散射体位置。
英文摘要：
We motivate metrology schemes based on topological singularities as a way to build robustness against deformations of the system. In particular, we relate reference settings of metrological systems to topological singularities in the measurement outputs. As examples we discuss optical nano-position sensing (i) using a balanced photodetector and a quadrant photodetector, and (ii) a more general image based scheme. In both cases the reference setting is a scatterer position that corresponds to a topological singularity in an output space constructed from the scattered field intensity distributions.
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