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arXiv 1504.02871cond-mat.mtrl-scicond-mat.mes-hall
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InAs/GaSb超晶格中的垂直输运:电离杂质和界面粗糙散射的作用

Vertical transport in InAs/GaSb superlattice: role of ionized impurity and interface roughness scatterings

Sara Safa, Asghar Asgari

摘要:

本文利用界面粗糙度散射和电离杂质散射研究了InAs/GaSb超晶格中垂直电子迁移率随温度的变化。用有限差分K.P方法计算了InAs/Gasb超晶格的能带结构,研究了它们的输运性质。研究了几个结构参数如层厚、界面粗糙度、相关长度和离子密度等对垂直迁移率的影响。理论模拟结果表明,这两种散射机制在低温和薄层系统中是重要的。

英文摘要:

We report on the vertical electron mobility versus temperature by applying the interface roughness scattering and ionized impurity scattering in InAs/GaSb superlattices. Using the Finite difference K.P method, we calculated the band structure of InAs/Gasb superlattices and then studied the transport properties of these systems. Several structural parameters such as layer thicknesses, interface roughness height, correlation length and ion density have been investigated and characterized that how the vertical mobility change with varying these parameters. Theoretical modeling results show that these two scattering mechanism are important in lower temperatures and thin layer systems.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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