线性动态AFM中纳米级相互作用的变频表征：一种FFM引物
Variable frequency characterization of interaction at nanoscale in linear dynamic AFM: an FFM primer
摘要：
使用AFM针尖和金属表面之间的静电耦合作为测试相互作用，我们在这里提出的针尖和表面之间的力的测量，连同相互作用的刚度和相关的耗散的测量。这三个量构成了纳米级相互作用的完整表征。它们在同一地点独立、同时和定量测量。这是可能的，由于力反馈方法，确保了直流固定的尖端和亚纳米振荡的尖端的同时应用程序。在此建立的线性制度，刚度和阻尼直接从振幅和相位变化的测量。这种线性变换所需要的信息仅仅是实验背景下的杠杆性质。在我们这里探索的频率范围内，k、其刚度、其阻尼系数和Q0（其第一共振频率）的知识被证明是足够的。最后，我们证明了这种方法不限于杠杆共振频率。相反，这种相互作用的表征，其分辨率是有限的布朗运动，可以使用在任何频率基本上相同的性能。我们相信，在线性响应的背景下，在纳米尺度上，在杠杆共振之外同时独立地测量力、刚度和阻尼，定义了一种新的原子力显微镜范式，我们称之为力反馈显微镜（FFM）。这篇文章详细介绍了使用FFM使用一个众所周知的和容易实现的静电之间的相互作用，在空气中的常规AFM针尖和金属表面。
英文摘要：
Using electrostatic coupling between an AFM tip and a metallic surface as a test interaction, we here present the measurement of the force between the tip and the surface, together with the measurement of the interaction stiffness and the associated dissipation. These three quantities constitute a full characterization of the interaction at nanoscale. They are measured independently, simultaneously and quantitatively at the same place. This is made possible thanks to a force feedback method that ensures the DC immobility of the tip and to the simultaneous application of a sub-nanometer oscillation to the tip. In this established linear regime, stiffness and damping are directly obtained from amplitude and phase change measurements. The needed information for this linear transformation is solely the lever properties in the experimental context. Knowledge of k, its stiffness, its damping coefficient and Q0, its first resonance frequency is shown to be sufficient in the frequency range we are here exploring. Finally, we demonstrate that this method is not restricted to the lever resonance frequency. To the contrary, this interaction characterization whose resolution is limited by the Brownian motion, can be used at any frequencies with essentially the same performances. We believe that simultaneous and independent measurements of force, stiffness and damping, out of lever resonance, at nanoscale, and within the context of linear response define a new AFM paradigm that we call Force Feedback Microscopy (FFM). This article details the use of FFM using a well known and easy to implement electrostatic interaction between a regular AFM tip and a metallic surface in air.
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