Ba $^+$的$5D_{5/2}$能级的支化分数和寿命的测量
Measurement of the branching fractions and lifetime of the $5D_{5/2}$ level of Ba$^+$
摘要：
我们提出了一个测量的分支分数衰变从长寿命的$5D_{5/2}$水平在\Ba。发现衰变到$6S_{1/2}$基态的分支分数为$0.846(25)_{\mathrm{stat}}(4)_{\mathrm{sys}}$。我们还报告了一种改进的测量$5D_{5/2}$寿命，$τ_{5D_{5/2}}=31.2(0.9)$ ~s。这些测量一起提供了第一个实验测定的过渡率衰变出的$5D_{5/2}$水平。进行这些测量的离子阱中的低（$<7 \times 10^{-12}$ ~Torr）压力简化了数据采集和分析。实验结果与理论预测的过渡率的比较显示出良好的一致性。
英文摘要：
We present a measurement of the branching fractions for decay from the long-lived $5D_{5/2}$ level in \Ba. The branching fraction for decay into the $6S_{1/2}$ ground state was found to be $0.846(25)_{\mathrm{stat}}(4)_{\mathrm{sys}}$. We also report an improved measurement of the $5D_{5/2}$ lifetime, $τ_{5D_{5/2}}=31.2(0.9)$~s. Together these measurements provide the first experimental determination of transition rates for decay out of the $5D_{5/2}$ level. The low ($<7 \times 10^{-12}$~Torr) pressure in the ion trap in which these measurements were made simplified data acquisition and analysis. Comparison of the experimental results with theoretical predictions of the transition rates shows good agreement.
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