Al和Si的$Kα_{1,2}$ X射线谱线结构和宽度的MCDF-RCI预测
MCDF-RCI predictions for structure and width of $Kα_{1,2}$ x-ray line of Al and Si
摘要：
用多组态Dirac-Fock方法和相对论组态相互作用方法计算了Al和Si的$Kα_{1,2}$ X射线谱线的结构和宽度。研究了电子关联和包含可能的卫星贡献对谱结构的影响。计算了Al和Si的$K$和$L_{2,3}$能级宽度。
英文摘要：
Multiconfiguration Dirac-Fock and Relativistic Configuration Interaction methods have been employed to predict the structure and the width of $Kα_{1,2}$ x-ray lines of Al and Si. The influences of electron correlation and inclusion of possible satellite contributions on spectra structure have been studied. The widths of $K$ and $L_{2,3}$ atomic levels of Al and Si have been also computed.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
