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arXiv 1309.2010cond-mat.mes-hall
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具有导热纳米线探针的纳米级分辨率扫描热显微镜

Nanoscale resolution scanning thermal microscopy with thermally conductive nanowire probes

Maria Timofeeva, Alexey Bolshakov, Peter D. Tovee, Dagou A. Zeze, Vladimir G. Dubrovskii, Oleg V. Kolosov

摘要:

扫描热显微镜(SThM)-一种扫描探针显微镜,允许映射纳米器件中的热传输和温度,正在成为一种关键方法,可能有助于解决现代处理器中的散热问题,并开发新的热电材料。不幸的是,当前SThM实施方式在测量高热导率材料中的性能仍然有限。这些限制的原因是双重的,首先,SThM测量的高热导率材料需要足够高的探头顶端的热导率,其次,探头和样品之间的热接触的质量变得强烈影响的纳米级表面波纹的研究样品。在本文中,我们开发的SThM方法,可以解决这些复杂的问题的分析模型-通过探索高热导率纳米线作为尖端顶点,并探讨SThM探针和研究表面之间的接触电阻,后者变得特别重要时,尖端和表面都具有高热导率。我们开发的分析模型支持的有限元分析模拟和实验测试的SThM原型使用碳纳米管(CNT)在尖端顶点作为导热纳米线。这些结果阐明了从一侧的SThM探头的性能和从另一侧的热导率,探头的几何形状和其组件之间的重要关系,为克服当前的SThM的限制提供了途径。

英文摘要:

Scanning thermal microscopy (SThM) - a type of scanning probe microscopy that allows mapping thermal transport and temperatures in nanoscale devices, is becoming a key approach that may help to resolve heat dissipation problems in modern processors and develop new thermoelectric materials. Unfortunately, performance of current SThM implementations in measurement of high thermal conductivity materials continues to me limited. The reason for these limitations is two-fold - first, SThM measurements of high thermal conductivity materials need adequate high thermal conductivity of the probe apex, and secondly, the quality of thermal contact between the probe and the sample becomes strongly affected by the nanoscale surface corrugations of the studied sample. In this paper we develop analytical models of the SThM approach that can tackle these complex problems - by exploring high thermal conductivity nanowires as a tip apex, and exploring contact resistance between the SThM probe and studied surface, the latter becoming particularly important when both tip and surface have high thermal conductivities. We develop analytical model supported by the finite element analysis simulations and by the experimental tests of SThM prototype using carbon nanotube (CNT) at the tip apex as a heat conducting nanowire. These results elucidate vital relationships between the performance of the probe in SThM from one side and thermal conductivity, geometry of the probe and its components from the other, providing pathway for overcoming current limitations of SThM.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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